Extrapolating single isotherm Prony parameters beyond experimental test windows introduces exponential error growth governed by unconstrained relaxation modes.
Prony series modeling converts polymer relaxation data into actionable sensor zero-drift predictions, isolating packaging strain from true physical signals.
Viscoelastic relaxation in polymer die attach causes time-dependent strain transfer to MEMS proof masses, driving long-term zero-g offset drift.
Baseline Prony series parameters extracted from room temperature dynamic mechanical analysis require non-negative least squares fitting and compliance-corrected frequency sweeps bounded between 0.01 Hz and 100 Hz.
Generalized Maxwell models under cryogenic thermal ramps require Arrhenius shift functions and thermal lag compensation to accurately predict stress relaxation bounds.
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