Drift Correction
Mathematical calculations offset the predictable drift that occurs in silicon pressure sensors as their environmental conditions fluctuate. Implementing a temperature compensation algorithm allows a microcontroller to adjust raw sensor outputs and maintain measurement accuracy across a wide operating range. This mathematical correction is required because thermal changes alter the physical properties of the sensing element.
Mathematical Framework
The correction is often implemented as a polynomial equation that uses temperature as an input variable. Calibration coefficients for the polynomial are calculated during factory testing by measuring the sensor’s output at several temperature points. These coefficients are stored in the device’s memory.
Calibration Routine
Executing the calibration requires placing the sensor in a temperature-controlled chamber and recording its output at known reference points. This procedure must be executed with high precision to ensure the calculated coefficients are accurate. In highly accurate devices, multi-point calibration is used to capture non-linear thermal behaviors.
This generates a dense matrix of compensation values that provides excellent accuracy across the entire operating range, allowing the sensor to perform within its rated tolerance even under extreme environmental conditions that would otherwise cause measurement drift.
Operational Boundary
Algorithmic effectiveness depends on the accuracy of the internal temperature sensor used for compensation. If there is a thermal lag between the sensing element and the temperature transducer, transient errors can occur. For this reason, the temperature sensor is placed as close as possible to the primary sensing element to ensure they are in thermal equilibrium.