Documented Deviation
A published document listing the known deviations of an integrated circuit from its official datasheet is an essential resource for system design. The silicon errata describe the bugs, anomalies, and workarounds for a specific chip version or stepping. This document is updated by the chip manufacturer as new issues are discovered during production or testing.
Calibration Interference
Design issues in the analog-to-digital converter or internal reference can introduce non-linearities and offsets. The silicon errata often provide the specific mathematical formulas or workarounds needed to correct these errors. If these errors are not corrected, they can severely degrade the measurement accuracy of the connected sensors.
The software must incorporate these corrections during the sensor calibration and data processing stages.
Workaround Implementation
Implementing the recommended workarounds requires modifying the device driver or firmware to avoid the affected hardware states. This can involve disabling certain power-saving modes or using alternative pins for communication. The system must be thoroughly tested to ensure the workarounds do not introduce new performance issues.
Our testing verifies that implementing these workarounds restores the measurement system to its expected performance. This verification must be conducted across the entire operating temperature range to ensure stability.
Risk Management
Reviewing the errata before starting a new design prevents costly hardware revisions later in the development cycle. This risk management practice is standard for high-reliability applications where system downtime cannot be tolerated. The final design is certified only after all the relevant errata have been analyzed and addressed.