Output Linearization
Mathematical characterization establishes the relationship between raw electronic resistance changes and applied physical force across a defined measurement range. This procedure, which is the foundation of piezoresistive sensor calibration, corrects for inherent material non-linearities in the silicon diaphragm. High-precision measurements of voltage output at fixed pressures are recorded to generate unique calibration coefficients for each transducer, ensuring that the sensor achieves its specified system accuracy under all operating conditions.
Temperature Compensation
Semiconductor strain gauges exhibit sensitivity to temperature shifts that masquerade as pressure changes. During piezoresistive sensor calibration, the sensor is cycled through a thermal chamber while zero-pressure and full-scale pressure readings are taken. This allows the signal conditioner to actively adjust the sensor output using a localized temperature measurement.
Reference Standard
Traceable deadweight testers or high-accuracy pressure controllers provide the reference pressures used to generate calibration profiles. The accuracy of piezoresistive sensor calibration is constrained by the uncertainty of these master instruments. A typical setup utilizes reference sensors with an accuracy five times greater than the sensor under test.
Drift Isolation
Long-term mechanical relaxation in the sensor assembly introduces offset changes over time. Repetitive testing during piezoresistive sensor calibration identifies sensors with unstable offsets, which are then rejected before shipment. This screen prevents field failures and reduces maintenance cycles for the end-user.